[n] M. Ben Abdillah, “Novel Electrostatic Beam Position Monitors With Enhanced Sensitivity”, in Proc. IBIC'16, Barcelona, Spain, Sep. 2016, pp. 333-335. doi:10.18429/JACoW-IBIC2016-TUPG09
Use Complete Form
Paper Title: Novel Electrostatic Beam Position Monitors With Enhanced Sensitivity
Paper URL: https://jacow.org/ibic2016/papers/TUPG09.pdf
Conference: 5th Int. Beam Instrumentation Conf. (IBIC'16)
Paper ID: TUPG09
Location in proceedings: 333-335
Original Author String: M. Ben Abdillah [IPN, Orsay, France]