[n] S. Udrea et al., “Preparatory Work for a Fluorescence Based Profile Monitor for an Electron Lens”, in Proc. IBIC'16, Barcelona, Spain, Sep. 2016, pp. 528-531. doi:10.18429/JACoW-IBIC2016-TUPG73
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Paper Title: Preparatory Work for a Fluorescence Based Profile Monitor for an Electron Lens
Paper URL: https://jacow.org/ibic2016/papers/TUPG73.pdf
Conference: 5th Int. Beam Instrumentation Conf. (IBIC'16)
Paper ID: TUPG73
Location in proceedings: 528-531
Original Author String: S. Udrea, P. Forck [GSI, Darmstadt, Germany] E. Barrios Diaz, O.R. Jones, P. Magagnin, G. Schneider, R. Veness [CERN, Geneva, Switzerland] P. Forck, S. Udrea [IAP, Frankfurt am Main, Germany] V. Tzoganis, C.P. Welsch, H.D. Zhang [Cockcroft Institute, Warrington, Cheshire, United Kingdom]