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[n]	S. Ikeda, E. N. Beebe, and S. A. Kondrashev, “Development of a Double-Sided Electron Beam Loss Detector for Extended EBIS at BNL”, presented at the EBIST2022, Whistler, BC, Canada, Jun. 2022, paper TH2WH01, unpublished. 

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Paper Title: Development of a Double-Sided Electron Beam Loss Detector for Extended EBIS at BNL
Conference: 14th International Symposium of EBIS/T (EBIST2022)
Paper ID: TH2WH01
Original Author String: S. Ikeda, E.N. Beebe, S.A. Kondrashev

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