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[n]	C. E. Reece, J. W. Angle, M. J. Kelley, and E. M. Lechner, “SIMS Characterization of Nitrogen Doping of LCLS-II-HE Production Cavities”, in Proc. SRF'23, Grand Rapids, MI, USA, Jun. 2023, pp. 67-69. doi:10.18429/JACoW-SRF2023-MOPMB006

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Paper Title: SIMS Characterization of Nitrogen Doping of LCLS-II-HE Production Cavities
Conference: 21th Int. Conf. RF Superconductivity (SRF'23)
Paper ID: MOPMB006
Location in proceedings: 67-69
Original Author String: C. E. Reece,J. W. Angle,M. J. Kelley,E. M. Lechner

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