[n] A. Cierpka, S. Keckert, J. Knobloch, F. Kramer, and O. Kugeler, “Analysis of Semiconductor Components as Temperature Sensors for Cryogenic Investigation of SRF Materials”, in Proc. SRF'23, Grand Rapids, MI, USA, Jun. 2023, pp. 80-83. doi:10.18429/JACoW-SRF2023-MOPMB010
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Paper Title: Analysis of Semiconductor Components as Temperature Sensors for Cryogenic Investigation of SRF Materials
Conference: 21th Int. Conf. RF Superconductivity (SRF'23)
Paper ID: MOPMB010
Location in proceedings: 80-83
Original Author String: A. Cierpka,S. Keckert,J. Knobloch,F. Kramer,O. Kugeler