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[n]	D. A. Walsh, S. P. Jamison, E. W. Snedden, and T. Lefevre, “A High Resolution Single-Shot Longitudinal Profile Diagnostic Using Electro-Optic Transposition”, in Proc. IBIC'16, Barcelona, Spain, Sep. 2016, pp. 752-755. doi:10.18429/JACoW-IBIC2016-WEPG49

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Paper Title: A High Resolution Single-Shot Longitudinal Profile Diagnostic Using Electro-Optic Transposition
Paper URL: https://jacow.org/ibic2016/papers/WEPG49.pdf
Conference: 5th Int. Beam Instrumentation Conf. (IBIC'16)
Paper ID: WEPG49
Location in proceedings: 752-755
Original Author String: D.A. Walsh, S.P. Jamison, E.W. Snedden [STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom] T. Lefevre (T. Lef?¿vre) [CERN, Geneva, Switzerland]

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