[n] J. Gao, J. Le Duff, and Y. Thiery, “Design Studies for a High Current Bunching System for CLIC Test Facility (CTF3) Drive Beam”, in Proc. LINAC'00, Monterey, CA, USA, Aug. 2000, paper MOB01, pp. 95-97.
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Paper Title: Design Studies for a High Current Bunching System for CLIC Test Facility (CTF3) Drive Beam
Paper URL: https://jacow.org/l00/papers/MOB01.pdf
Conference: 20th Linear Accelerator Conf. (LINAC'00)
Paper ID: MOB01
Location in proceedings: 95-97
Original Author String: J. Gao, J. Le Duff, Y. Thiery