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[n]	C. E. Reece, N. Pogue, and P. M. McIntyre, “Ultimate-Gradient Srf Test Cavity and Low Loss Tangent Measurements in Ultra Pure Sapphire”, in Proc. LINAC'10, Tsukuba, Japan, Sep. 2010, paper THP038, pp. 842-844. 

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Paper Title: Ultimate-Gradient Srf Test Cavity and Low Loss Tangent Measurements in Ultra Pure Sapphire
Paper URL: https://jacow.org/LINAC2010/papers/THP038.pdf
Conference: 25th Linear Accelerator Conf. (LINAC'10)
Paper ID: THP038
Location in proceedings: 842-844
Original Author String: C. E. Reece, N. Pogue, P. M. McIntyre

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