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Reference

For Word

[n]	T. Sieber et al., “Cryogenic Current Comparators as Low Intensity Diagnostics for Ion Beams”, in Proc. IBIC'23, Saskatoon, Canada, Sep. 2023, pp. 268-272. doi:10.18429/JACoW-IBIC2023-TUP036

For LaTeX

%\cite{Sieber:IBIC23-TUP036} \bibitem{Sieber:IBIC23-TUP036} T. Sieber \emph{et al.}, \textquotedblleft{Cryogenic Current Comparators as Low Intensity Diagnostics for Ion Beams}\textquotedblright, in \emph{Proc. IBIC’23}, Saskatoon, Canada, Sep. 2023, pp. 268--272. \url{doi:10.18429/JACoW-IBIC2023-TUP036}

For BibTeX

@inproceedings{sieber:ibic23-tup036, author = {T. Sieber and others}, title = {{Cryogenic Current Comparators as Low Intensity Diagnostics for Ion Beams}}, booktitle = {Proc. IBIC'23}, pages = {268--272}, paper = {TUP036}, venue = {Saskatoon, Canada}, series = {International Beam Instrumentation Conference}, number = {13}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {12}, year = {2023}, issn = {2673-5350}, isbn = {978-3-95-450236-3}, doi = {10.18429/JACoW-IBIC2023-TUP036}, language = {english} }

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Metadata

Paper Title: Cryogenic Current Comparators as Low Intensity Diagnostics for Ion Beams
Conference: 12th International Beam Instrumentation Conference (IBIC'23)
Paper ID: TUP036
Location in proceedings: 268-272
Original Author String: T. Sieber,L. Crescimbeni,D. M. Haider,N. Marsic,M. Schmelz,F. Schmid,M. Schwickert,R. Stolz,T. Stöhlker,J. Tan,V. Tympel,V. Zakosarenko

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