[n] R. M. Thurman-Keup, C. E. Lundberg, D. Slimmer, and J. R. Zagel, “A Study of the Gain of Microchannel Plates in the Ionization Profile Monitors at Fermilab”, in Proc. IBIC'23, Saskatoon, Canada, Sep. 2023, pp. 405-409. doi:10.18429/JACoW-IBIC2023-WEP025
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Paper Title: A Study of the Gain of Microchannel Plates in the Ionization Profile Monitors at Fermilab
Conference: 12th International Beam Instrumentation Conference (IBIC'23)
Paper ID: WEP025
Location in proceedings: 405-409
Original Author String: R. M. Thurman-Keup,C. E. Lundberg,D. Slimmer,J. R. Zagel