[n] T. Luo et al., “Electromagnetic bench testing of ALS upgrade beam monitor buttons and assemblies”, in Proc. IPAC'24, Nashville, TN, USA, May 2024, pp. 2365-2367. doi:10.18429/JACoW-IPAC2024-WEPG61
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Paper Title: Electromagnetic bench testing of ALS upgrade beam monitor buttons and assemblies
Conference: 15th Int. Particle Accelerator Conf. (IPAC'24)
Paper ID: WEPG61
Location in proceedings: 2365-2367
Original Author String: T. Luo, A. Jurado, C. Sun, D. Wang, M. Tung, P. Centeno, R. Mascote, S. Omolayo, S. De Santis, T. Gaucher