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[n]	W. Fung, Y. Hao, and D. Xu, “Data driven methods to recognize patterns in EIC weak-strong simulation”, in Proc. IPAC'25, Taipei, Taiwan, Jun. 2025, pp. 1996-1999. doi:10.18429/JACoW-IPAC2025-WEPM019

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Paper Title: Data driven methods to recognize patterns in EIC weak-strong simulation
Conference: 16th Int. Particle Accelerator Conf. (IPAC'25)
Paper ID: WEPM019
Location in proceedings: 1996-1999
Original Author String: W. Fung, Y. Hao, D. Xu

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