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[n]	A. Lokey, “Image mapping for multiple charge state beams using a beam induced fluorescence profile monitors”, in Proc. HIAT'25, East Lansing, MI, USA, Jun. 2025, pp. 235-237. doi:10.18429/JACoW-HIAT2025-WEP06

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Paper Title: Image mapping for multiple charge state beams using a beam induced fluorescence profile monitors
Conference: 16th Int. Conf. on Heavy Ion Accelerator Technology (HIAT'25)
Paper ID: WEP06
Location in proceedings: 235-237
Original Author String: A. Lokey

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