[n] J. Hirschman et al., “High-throughput, low-latency X-ray characterization for attosecond XFEL diagnostics: A heterogeneous approach”, presented at the NAPAC'25, Sacramento, California, USA, Aug. 2025, paper MOP046, unpublished.
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Paper Title: High-throughput, low-latency X-ray characterization for attosecond XFEL diagnostics: A heterogeneous approach
Conference: 6th North American Particle Accelerator Conference (NAPAC'25)
Paper ID: MOP046
Original Author String: J. Hirschman, B. Mencer, A. Shackelford, A. Dave, M. Mishra, A. Therrien, R. Obaid, R. Coffee