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[n]	P. Owusu, C. Zhang, A. Bartnik, J. Maxson, and S. Karkare, “Optimizing 4D emittance measurements using the pinhole scan technique”, in Proc. NAPAC'25, Sacramento, California, USA, Aug. 2025, pp. 543-547. doi:10.18429/JACoW-NAPAC2025-TUP075

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Paper Title: Optimizing 4D emittance measurements using the pinhole scan technique
Conference: 6th North American Particle Accelerator Conference (NAPAC'25)
Paper ID: TUP075
Location in proceedings: 543-547
Original Author String: P. Owusu, C. Zhang, A. Bartnik, J. Maxson, S. Karkare

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