[n] S. Biedron et al., “High Energy Heavy Ion Single Event Effects (HE HISEE): Planning for the future of microelectronics”, in Proc. NAPAC'25, Sacramento, California, USA, Aug. 2025, paper THP041, pp. 1034-1037.
Use Complete Form
Paper Title: High Energy Heavy Ion Single Event Effects (HE HISEE): Planning for the future of microelectronics
Conference: 6th North American Particle Accelerator Conference (NAPAC'25)
Paper ID: THP041
Location in proceedings: 1034-1037
Original Author String: S. Biedron, A. Lowe, D. Marrujo, E. Everts, G. Van Dyk, J. DeFilippi, J. Millspaugh, J. Miller, K. Avery, K. LaBel, M. Bedel, M. Stapleton, R. Leonard, T. Turflinger