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[n]	S. LIU, S. Jiang, W. Qin, X. Li, and X. Liu, “Analysis of Beam Loading Effect of Dark Current in C-Band Photocathode Electron Gun”, presented at the IPAC'26, Deauville, France, May 2026, paper TUP2697, this conference. 

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Paper Title: Analysis of Beam Loading Effect of Dark Current in C-Band Photocathode Electron Gun
Conference: 17th Int. Particle Accelerator Conf. (IPAC'26)
Paper ID: TUP2697
Original Author String: S. LIU, S. Jiang, W. Qin, X. Li, X. Liu

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