[n] S. Chen, Y. He, D. Luo, and T. Tan, “Atomic-scale monitoring of oxide decomposition and nanocrystallization in Nb during Medium-T baking”, presented at the SRF'25, Tokyo, Japan, Sep. 2025, paper MOP17, unpublished.
Use Complete Form
Paper Title: Atomic-scale monitoring of oxide decomposition and nanocrystallization in Nb during Medium-T baking
Conference: 22st International Conference on RF Superconductivity (SRF'25)
Paper ID: MOP17
Original Author String: S. Chen, Y. He, D. Luo, T. Tan