JaCoW Logo

Reference Search

Reference


For Word

[n]	Z. Thune, S. Balachandran, and T. Bieler, “The effects of strain path and strain magnitude on the uniformity of recrystallization in high-RRR niobium 1.3 GHz half-cells”, presented at the SRF'25, Tokyo, Japan, Sep. 2025, paper THP56, unpublished. 

For LaTeX

For BibTeX

Use Complete Form

Metadata

Paper Title: The effects of strain path and strain magnitude on the uniformity of recrystallization in high-RRR niobium 1.3 GHz half-cells
Conference: 22st International Conference on RF Superconductivity (SRF'25)
Paper ID: THP56
Original Author String: Z. Thune, S. Balachandran, T. Bieler

Associated Authors


Back to the list