[n] E. Viklund, S. Posen, and D. N. Seidman, “Microstructural characterization of Nb3Sn thin films using 3D FIB tomography”, presented at the SRF'25, Tokyo, Japan, Sep. 2025, paper THP35, unpublished.
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Paper Title: Microstructural characterization of Nb3Sn thin films using 3D FIB tomography
Conference: 22st International Conference on RF Superconductivity (SRF'25)
Paper ID: THP35
Original Author String: E. Viklund, S. Posen, D.N. Seidman