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[n]	S. Chen, Y. He, D. Luo, and T. Tan, “Atomic-scale monitoring of oxide decomposition and nanocrystallization in Nb during Medium-T baking”, in Proc. SRF'25, Tokyo, Japan, Sep. 2025, pp. 89-92. doi:10.18429/JACoW-SRF2025-MOP17

For LaTeX

%\cite{Chen:SRF25-MOP17} \bibitem{Chen:SRF25-MOP17} S. Chen, Y. He, D. Luo, and T. Tan, \textquotedblleft{Atomic-scale monitoring of oxide decomposition and nanocrystallization in Nb during Medium-T baking}\textquotedblright, in \emph{Proc. SRF’25}, Tokyo, Japan, Sep. 2025, pp. 89--92. \doi{10.18429/JACoW-SRF2025-MOP17}

For BibTeX

@inproceedings{chen:srf25-mop17, author = {S. Chen and Y. He and D. Luo and T. Tan}, title = {{Atomic-scale monitoring of oxide decomposition and nanocrystallization in Nb during Medium-T baking}}, booktitle = {Proc. SRF'25}, pages = {89--92}, paper = {MOP17}, venue = {Tokyo, Japan}, series = {Int. Conf. on RF Superconductivity}, number = {22}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2026}, issn = {2673-5504}, isbn = {978-3-95-450256-1}, doi = {10.18429/JACoW-SRF2025-MOP17}, language = {english} }

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Metadata

Paper Title: Atomic-scale monitoring of oxide decomposition and nanocrystallization in Nb during Medium-T baking
Conference: 22st International Conference on RF Superconductivity (SRF'25)
Paper ID: MOP17
Location in proceedings: 89-92
Original Author String: S. Chen, Y. He, D. Luo, T. Tan

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