Reference Search

Reference

For Word

[n]	R. Venugopal et al., “Quality factor analysis of surface-passivated cavities at low gradients applying two level system models”, in Proc. SRF'25, Tokyo, Japan, Sep. 2025, pp. 345-348. doi:10.18429/JACoW-SRF2025-TUP16

For LaTeX

%\cite{Venugopal:SRF25-TUP16} \bibitem{Venugopal:SRF25-TUP16} R. Venugopal \emph{et al.}, \textquotedblleft{Quality factor analysis of surface-passivated cavities at low gradients applying two level system models}\textquotedblright, in \emph{Proc. SRF’25}, Tokyo, Japan, Sep. 2025, pp. 345--348. \doi{10.18429/JACoW-SRF2025-TUP16}

For BibTeX

@inproceedings{venugopal:srf25-tup16, author = {R. Venugopal and others}, title = {{Quality factor analysis of surface-passivated cavities at low gradients applying two level system models}}, booktitle = {Proc. SRF'25}, pages = {345--348}, paper = {TUP16}, venue = {Tokyo, Japan}, series = {Int. Conf. on RF Superconductivity}, number = {22}, publisher = {JACoW Publishing, Geneva, Switzerland}, month = {11}, year = {2026}, issn = {2673-5504}, isbn = {978-3-95-450256-1}, doi = {10.18429/JACoW-SRF2025-TUP16}, language = {english} }

Use Complete Form

Metadata

Paper Title: Quality factor analysis of surface-passivated cavities at low gradients applying two level system models
Conference: 22st International Conference on RF Superconductivity (SRF'25)
Paper ID: TUP16
Location in proceedings: 345-348
Original Author String: R. Venugopal, K. Kasprzak, M. Wiencek, G.K. Deyu, M. Voige, R. Zierold, R. H. Blick, W. Hillert, H. Weise, M. Wenskat

Associated Authors

Back to the list