[n] S. Mathews, A. Macpherson, and N. Stapley, “An end-to-end approach of optical inspection on the RF surface”, in Proc. SRF'25, Tokyo, Japan, Sep. 2025, pp. 597-603. doi:10.18429/JACoW-SRF2025-THB03
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Paper Title: An end-to-end approach of optical inspection on the RF surface
Conference: 22st International Conference on RF Superconductivity (SRF'25)
Paper ID: THB03
Location in proceedings: 597-603
Original Author String: S. Mathews, A. Macpherson, N. Stapley