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[n]	S. Mathews, A. Macpherson, and N. Stapley, “An end-to-end approach of optical inspection on the RF surface”, in Proc. SRF'25, Tokyo, Japan, Sep. 2025, paper THB03, pp. 597-603. 

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Paper Title: An end-to-end approach of optical inspection on the RF surface
Conference: 22st International Conference on RF Superconductivity (SRF'25)
Paper ID: THB03
Location in proceedings: 597-603
Original Author String: S. Mathews, A. Macpherson, N. Stapley

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