[n] D. Seal et al., “A LHe-free test facility for thin film SRF cavity testing”, in Proc. SRF'25, Tokyo, Japan, Sep. 2025, pp. 654-660. doi:10.18429/JACoW-SRF2025-THP24
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Paper Title: A LHe-free test facility for thin film SRF cavity testing
Conference: 22st International Conference on RF Superconductivity (SRF'25)
Paper ID: THP24
Location in proceedings: 654-660
Original Author String: D. Seal, G. Burt, N. Leicester, O. Malyshev, H. Marks, A. Mogheyseh, O. Poynton, J. Rigby, L. Smith, W. Jouri