[n] V. Chouhan et al., “Improving the performance of mid-T baked niobium cavities through post-bake surface treatment”, in Proc. SRF'25, Tokyo, Japan, Sep. 2025, pp. 805-810. doi:10.18429/JACoW-SRF2025-THP83
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Paper Title: Improving the performance of mid-T baked niobium cavities through post-bake surface treatment
Conference: 22st International Conference on RF Superconductivity (SRF'25)
Paper ID: THP83
Location in proceedings: 805-810
Original Author String: V. Chouhan, D. Bice, A. Cravatta, B. Guilfoyle, A. Murthy, A. Netepenko, T. Reid, T. Ring, D. Smith, G. Wu