[n] P. Gessler et al., “Next Generation Electronics based on TCA for Beam-Diagnostics at FLASH and XFEL”, in Proc. DIPAC'11, Hamburg, Germany, May 2011, paper TUOB03, pp. 294-296.
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Paper Title: Next Generation Electronics based on TCA for Beam-Diagnostics at FLASH and XFEL
Paper URL: https://jacow.org/DIPAC2011/papers/TUOB03.pdf
Conference: 10th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'11)
Paper ID: TUOB03
Location in proceedings: 294-296
Original Author String: P. Gessler, M.K. Bock, M. Bousonville, M. Felber, M. Hoffmann, T. Jezynski, T. Lamb, F. Ludwig, G. Petrosyan, L.M. Petrosyan, K. Rehlich, S. Schulz, P. Vetrov, M. Zimmer [DESY, Hamburg, Germany] C. Bohm, A. Hidvegi (A. Hidv?®gi) [Stockholm University, Stockholm, Sweden] K. Czuba [Warsaw University of Technology, Institute of Electronic Systems, Warsaw, Poland] D.R. Makowski [TUL-DMCS, Lodz, Poland]
