[n] M. V. Fazio et al., “Evaluation of Performance, Reliability, and Risk for High Peak Power RF Sources from S-band through X-band for Advanced Accelerator Applications”, in Proc. IPAC'11, San Sebastian, Spain, Sep. 2011, paper THOBB01, pp. 2882-2884.
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Paper Title: Evaluation of Performance, Reliability, and Risk for High Peak Power RF Sources from S-band through X-band for Advanced Accelerator Applications
Paper URL: https://jacow.org/IPAC2011/papers/THOBB01.pdf
Conference: 2nd Int. Particle Accelerator Conf. (IPAC'11)
Paper ID: THOBB01
Location in proceedings: 2882-2884
Original Author String: M.V. Fazio, C. Adolphsen, A. Jensen, C. Pearson, D.W. Sprehn, A.E. Vlieks, F. Wang [SLAC, Menlo Park, California, USA] M.V. Fazio [LANL, Los Alamos, New Mexico, USA]
