[n] T. Tanaka et al., “SASE Saturation at the SCSS Test Accelerator Ranging from 50 nm to 60 nm”, in Proc. FEL'08, Gyeongju, Korea, Aug. 2008, paper FRAAU02, pp. 537-542.
Use Complete Form
Paper Title: SASE Saturation at the SCSS Test Accelerator Ranging from 50 nm to 60 nm
Paper URL: https://jacow.org/FEL2008/papers/FRAAU02.pdf
Conference: 30th Int. Free Electron Laser Conf. (FEL'08)
Paper ID: FRAAU02
Location in proceedings: 537-542
Original Author String: T. Tanaka, RIKEN Spring-8 Harima, Hyogo; T. Asaka, JASRI/SPring-8, Hyogo-ken; T. Fukui, T. Hara, RIKEN/SPring-8, Hyogo; T. Hasegawa, JASRI/SPring-8, Hyogo-ken; A. Higashiya, N. Hosoda, T. Inagaki, S. I. Inoue, T. Ishikawa, H. Kitamura, M. K. Kitamura, H. Maesaka, M. Nagasono, RIKEN/SPring-8, Hyogo; H. Ohashi, JASRI/SPring-8, Hyogo-ken; T. Ohshima, Y. Otake, T. Sakurai, T. Shintake, K. Shirasawa, RIKEN/SPring-8, Hyogo; S. Takahashi, JASRI/SPring-8, Hyogo-ken; H. Tanaka, RIKEN/SPring-8, Hyogo; S. Tanaka, JASRI/SPring-8, Hyogo-ken; T. Tanikawa, RIKEN Spring-8 Harima, Hyogo; K. Togawa, M. Yabashi, RIKEN/SPring-8, Hyogo
