[n] Y. Li, W. X. Cheng, K. Ha, and R. S. Rainer, “Transparent Lattice Characterization with Gated Turn-by-Turn Data of Diagnostic Bunch-Train”, in Proc. FLS'18, Shanghai, China, Mar. 2018, pp. 171-176. doi:10.18429/JACoW-FLS2018-THP2WB03
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Paper Title: Transparent Lattice Characterization with Gated Turn-by-Turn Data of Diagnostic Bunch-Train
Paper URL: https://jacow.org/fls2018/papers/THP2WB03.pdf
Conference: 60th ICFA Advanced Beam Dynamics Workshop on Future Light Sources (FLS'18)
Paper ID: THP2WB03
Location in proceedings: 171-176
Original Author String: Y. Li, W.X. Cheng, K. Ha, R.S. Rainer [BNL, Upton, Long Island, New York, USA]