[n] W. Blokland, “Non-invasive Beam Profile Measurements using an Electron-Beam Scanner”, in Proc. HB'10, Morschach, Switzerland, Sep.-Oct. 2010, paper WEO2A03, pp. 438-442.
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Paper Title: Non-invasive Beam Profile Measurements using an Electron-Beam Scanner
Paper URL: https://jacow.org/HB2010/papers/WEO2A03.pdf
Conference: 46th ICFA Advanced Beam Dynamics Workshop on High-Intensity and High-Brightness Hadron Beams (HB'10)
Paper ID: WEO2A03
Location in proceedings: 438-442
Original Author String: W. Blokland, ORNL, Oak Ridge, Tennessee