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[n]	T. Ieiri, J. W. Flanagan, H. Fukuma, Y. Ohnishi, and M. Tobiyama, “Measurement of Wakefield Effects caused by Electron Cloud at KEKB”, in Proc. IPAC'10, Kyoto, Japan, May 2010, paper TUPD008, pp. 1934-1936. 

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Paper Title: Measurement of Wakefield Effects caused by Electron Cloud at KEKB
Paper URL: http://accelconf.web.cern.ch/IPAC10/papers/TUPD008.pdf
Conference: 1st Int. Particle Accelerator Conf. (IPAC'10)
Paper ID: TUPD008
Location in proceedings: 1934-1936
Original Author String: T. Ieiri, J.W. Flanagan, H. Fukuma, Y. Ohnishi, M. Tobiyama, KEK, Ibaraki

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