[n] A. T. Wu et al., “Study of Low Temperature Baking Effect on Field Emission on Nb Samples Treated by BEP, EP, and BCP”, in Proc. IPAC'10, Kyoto, Japan, May 2010, paper WEPEC081, pp. 3067-3069.
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Paper Title: Study of Low Temperature Baking Effect on Field Emission on Nb Samples Treated by BEP, EP, and BCP
Paper URL: http://accelconf.web.cern.ch/IPAC10/papers/WEPEC081.pdf
Conference: 1st Int. Particle Accelerator Conf. (IPAC'10)
Paper ID: WEPEC081
Location in proceedings: 3067-3069
Original Author String: A.T. Wu, R.C. Ike, S. Jin, JLAB, Newport News, Virginia; X.Y. Lu, PKU/IHIP, Beijing; L.C. Macintyre, NSU, Newport News, Virginia; R.A. Rimmer, JLAB, Newport News, Virginia; K. Zhao, PKU/IHIP, Beijing
