[n] C. Xu, M. J. Kelley, and C. E. Reece, “Analyzing Surface Roughness Dependence of Linear RF Losses”, in Proc. LINAC'12, Tel Aviv, Israel, Sep. 2012, paper MOPB018, pp. 210-212.
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Paper Title: Analyzing Surface Roughness Dependence of Linear RF Losses
Paper URL: https://jacow.org/LINAC2012/papers/MOPB018.pdf
Conference: 26th Linear Accelerator Conf. (LINAC'12)
Paper ID: MOPB018
Location in proceedings: 210-212
Original Author String: C. Xu [The College of William and Mary, Williamsburg, USA] M.J. Kelley, C.E. Reece [JLAB, Newport News, Virginia, USA]