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[n]	C. E. Reece, A. D. Palczewski, and H. Tian, “A New Internal Optical Profilometry System for Characterization of RF Cavity Surfaces – CYCLOPS”, in Proc. LINAC'12, Tel Aviv, Israel, Sep. 2012, paper MOPB062, pp. 318-320. 

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Paper Title: A New Internal Optical Profilometry System for Characterization of RF Cavity Surfaces – CYCLOPS
Paper URL: https://jacow.org/LINAC2012/papers/MOPB062.pdf
Conference: 26th Linear Accelerator Conf. (LINAC'12)
Paper ID: MOPB062
Location in proceedings: 318-320
Original Author String: C.E. Reece, A.D. Palczewski, H. Tian [JLAB, Newport News, Virginia, USA]

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