[n] P. Thieberger et al., “Proposed Scattered Electron Detector System as One of the Beam Overlap Diagnostic Tools for the New RHIC Electron Lens”, in Proc. PAC'11, New York, NY, USA, Mar.-Apr. 2011, paper MOP209, pp. 489-491.
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Paper Title: Proposed Scattered Electron Detector System as One of the Beam Overlap Diagnostic Tools for the New RHIC Electron Lens
Paper URL: https://jacow.org/PAC2011/papers/MOP209.pdf
Conference: 24th Particle Accelerator Conf. (PAC'11)
Paper ID: MOP209
Location in proceedings: 489-491
Original Author String: P. Thieberger, E.N. Beebe, C. Chasman, W. Fischer, D.M. Gassner, X. Gu, R.C. Gupta, J. Hock, R.F. Lambiase, Y. Luo, M.G. Minty, C. Montag, M. Okamura, A.I. Pikin, Y. Tan, J.E. Tuozzolo, W. Zhang [BNL, Upton, Long Island, New York, USA]
