[n] Y. Li et al., “In-situ Secondary Electron Yield Measurement System at CesrTA”, in Proc. PAC'11, New York, NY, USA, Mar.-Apr. 2011, paper TUP230, pp. 1253-1255.
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Paper Title: In-situ Secondary Electron Yield Measurement System at CesrTA
Paper URL: https://jacow.org/PAC2011/papers/TUP230.pdf
Conference: 24th Particle Accelerator Conf. (PAC'11)
Paper ID: TUP230
Location in proceedings: 1253-1255
Original Author String: Y. Li, J.V. Conway, S. Greenwald, J.-S. Kim, V. Medjidzade, T.P. Moore, M.A. Palmer, C.R. Strohman [CLASSE, Ithaca, New York, USA] D. Asner [Carleton University, College of Natural Sciences, Ottawa, Ontario, Canada]
