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For Word

[n]	C. Xu, M. J. Kelley, C. E. Reece, and H. Tian, “Characterization of Scale-Dependent Roughness of Niobium Surfaces as a Function of Surface Treatment Processes”, in Proc. SRF'11, Chicago, IL, USA, Jul. 2011, paper THPO046, pp. 832-834.

For LaTeX

%\cite{CXu:SRF11-THPO046} \bibitem{CXu:SRF11-THPO046} C. Xu, M. J. Kelley, C. E. Reece, and H. Tian, \textquotedblleft{Characterization of Scale-Dependent Roughness of Niobium Surfaces as a Function of Surface Treatment Processes}\textquotedblright, in \emph{Proc. SRF’11}, Chicago, IL, USA, Jul. 2011, paper THPO046, pp. 832--834.

For BibTeX

@inproceedings{cxu:srf11-thpo046, author = {C. Xu and M. J. Kelley and C. E. Reece and H. Tian}, title = {{Characterization of Scale-Dependent Roughness of Niobium Surfaces as a Function of Surface Treatment Processes}}, booktitle = {Proc. SRF'11}, pages = {832--834}, paper = {THPO046}, venue = {Chicago, IL, USA, Jul. 2011}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF2011/papers/THPO046.pdf}, language = {english} }

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Metadata

Paper Title: Characterization of Scale-Dependent Roughness of Niobium Surfaces as a Function of Surface Treatment Processes
Paper URL: https://jacow.org/SRF2011/papers/THPO046.pdf
Conference: 15th Int. Conf. RF Superconductivity (SRF'11)
Paper ID: THPO046
Location in proceedings: 832-834
Original Author String: C. Xu, M.J. Kelley [The College of William and Mary, Williamsburg, USA] C.E. Reece, H. Tian [JLAB, Newport News, Virginia, USA]

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