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For Word

[n]	H. Jiang, T. R. Bieler, C. Compton, and T. L. Grimm, “Creep and Dimensional Stability of High Purity Niobium Electron Beam Welds”, in Proc. SRF'05, Ithaca, NY, USA, Jul. 2005, paper TUP53, pp. 369-371.

For LaTeX

%\cite{Jiang:SRF05-TUP53} \bibitem{Jiang:SRF05-TUP53} H. Jiang, T. R. Bieler, C. Compton, and T. L. Grimm, \textquotedblleft{Creep and Dimensional Stability of High Purity Niobium Electron Beam Welds}\textquotedblright, in \emph{Proc. SRF’05}, Ithaca, NY, USA, Jul. 2005, paper TUP53, pp. 369--371.

For BibTeX

@inproceedings{jiang:srf05-tup53, author = {H. Jiang and T. R. Bieler and C. Compton and T. L. Grimm}, title = {{Creep and Dimensional Stability of High Purity Niobium Electron Beam Welds}}, booktitle = {Proc. SRF'05}, pages = {369--371}, paper = {TUP53}, venue = {Ithaca, NY, USA, Jul. 2005}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/SRF2005/papers/TUP53.pdf}, language = {english} }

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Metadata

Paper Title: Creep and Dimensional Stability of High Purity Niobium Electron Beam Welds
Paper URL: https://jacow.org/SRF2005/papers/TUP53.pdf
Conference: 12th Int. Conf. RF Superconductivity (SRF'05)
Paper ID: TUP53
Location in proceedings: 369-371
Original Author String: H. Jiang, T.R. Bieler, C. Compton, T.L. Grimm, MSU, East Lansing, Michigan

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