[n] M. G. Fedurin, M. Babzien, V. Yakimenko, B. A. Allen, P. Muggli, and A. Y. Murokh, “Generation and Characterization of 5-micron Electron Beam for Probing Optical Scale Structures”, in Proc. IPAC'12, New Orleans, LA, USA, May 2012, paper WEPPP015, pp. 2753-2754.
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Paper Title: Generation and Characterization of 5-micron Electron Beam for Probing Optical Scale Structures
Paper URL: https://jacow.org/IPAC2012/papers/WEPPP015.pdf
Conference: 3rd Int. Particle Accelerator Conf. (IPAC'12)
Paper ID: WEPPP015
Location in proceedings: 2753-2754
Original Author String: M.G. Fedurin, M. Babzien, V. Yakimenko [BNL, Upton, Long Island, New York, USA] B.A. Allen [USC, Los Angeles, California, USA] P. Muggli [MPI, Muenchen, Germany] A.Y. Murokh [RadiaBeam, Santa Monica, USA]