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[n]	B. Schmidt, “Overview on Diagnostics for X- and XUV-FELs”, in Proc. 28th Int. Free Electron Laser Conf. (FEL'06), Berlin, Germany, Aug.-Sep. 2006, paper THCAU01, pp. 761-768. 

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Paper Title: Overview on Diagnostics for X- and XUV-FELs
Paper URL: https://jacow.org/f06/papers/THCAU01.pdf
Conference: 28th Int. Free Electron Laser Conf. (FEL'06)
Paper ID: THCAU01
Location in proceedings: 761-768
Original Author String: B. Schmidt, DESY, Hamburg

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