Reference Search

[n]	H. Ito et al., “Lower Critical Field Measurement of Thin Film Superconductor”, in Proc. LINAC'18, Beijing, China, Sep. 2018, pp. 484-487. doi:10.18429/JACoW-LINAC2018-TUPO066

Paper Title: Lower Critical Field Measurement of Thin Film Superconductor
Paper URL: https://jacow.org/linac2018/papers/TUPO066.pdf
Conference: 29th Linear Accelerator Conf. (LINAC'18)
Paper ID: TUPO066
Location in proceedings: 484-487
Original Author String: H. Ito [Sokendai, Ibaraki, Japan] C.Z. Antoine [CEA/IRFU, Gif-sur-Yvette, France] A. Four [CEA/DRF/IRFU, Gif-sur-Yvette, France] H. Hayano, T. Kubo, T. Saeki [KEK, Ibaraki, Japan] R. Ito, T. Nagata [ULVAC, Inc, Chiba, Japan] Y. Iwashita, R. Katayama, H. Tongu [Kyoto ICR, Uji, Kyoto, Japan] H. Oikawa [Utsunomiya University, Utsunomiya, Japan]

Associated Authors

• H. Hayano
• Y. Iwashita
• H. Tongu
• T. Kubo
• T. Saeki
• H. Oikawa
• T. Nagata
• C. Z. Antoine
• A. Four
• H. Ito
• R. Ito
• R. Katayama