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[n]	M. Kuriki, L. Guo, H. Iijima, and K. Miyoshi, “A Charge Lifetime Study of NEA GaAs Cathode by Ion Back-bombardment”, in Proc. IPAC'13, Shanghai, China, May 2013, paper MOPFI014, pp. 312-314. 

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Paper Title: A Charge Lifetime Study of NEA GaAs Cathode by Ion Back-bombardment
Paper URL: https://jacow.org/IPAC2013/papers/MOPFI014.pdf
Conference: 4th Int. Particle Accelerator Conf. (IPAC'13)
Paper ID: MOPFI014
Location in proceedings: 312-314
Original Author String: M. Kuriki [KEK, Ibaraki, Japan] L. Guo, H. Iijima, K. Miyoshi [HU/AdSM, Higashi-Hiroshima, Japan]

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