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[n]	X. Zhao, M. Krishnan, C. E. Reece, F. Williams, and Q. G. Yang, “Reciprocal Space XRD Mapping with Varied Incident Angle as a Probe of Structure Variation within Surface Depth”, in Proc. SRF'13, Paris, France, Sep. 2013, paper TUP084, pp. 651-658. 

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Paper Title: Reciprocal Space XRD Mapping with Varied Incident Angle as a Probe of Structure Variation within Surface Depth
Paper URL: https://jacow.org/SRF2013/papers/TUP084.pdf
Conference: 16th Int. Conf. RF Superconductivity (SRF'13)
Paper ID: TUP084
Location in proceedings: 651-658
Original Author String: X. Zhao [JLab, Newport News, Virginia, USA] M. Krishnan [AASC, San Leandro, California, USA] C.E. Reece [JLAB, Newport News, Virginia, USA] F. Williams, Q.G. Yang [NSU, Newport News, Virginia, USA]

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