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[n]	M. Wang, T. R. Bieler, D. Kang, and C. Compton, “Characterization of Microstructural Defects in SRF Cavity Niobium using Electron Channeling Contrast Imaging”, in Proc. SRF'17, Lanzhou, China, Jul. 2017, pp. 792-796. doi:10.18429/JACoW-SRF2017-THPB027

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Paper Title: Characterization of Microstructural Defects in SRF Cavity Niobium using Electron Channeling Contrast Imaging
Paper URL: https://jacow.org/srf2017/papers/THPB027.pdf
Conference: 18th Int. Conf. RF Superconductivity (SRF'17)
Paper ID: THPB027
Location in proceedings: 792-796
Original Author String: M. Wang, T.R. Bieler, D. Kang [Michigan State University, East Lansing, Michigan, USA] C. Compton [FRIB, East Lansing, Michigan, USA]

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