[n] J. Tuggle, M. J. Kelley, U. Pudasaini, A. D. Palczewski, C. E. Reece, and F. A. Stevie, “Fundamental SIMS Analyses for Nitrogen-enriched Niobium”, in Proc. SRF'17, Lanzhou, China, Jul. 2017, pp. 821-824. doi:10.18429/JACoW-SRF2017-THPB036
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Paper Title: Fundamental SIMS Analyses for Nitrogen-enriched Niobium
Paper URL: https://jacow.org/srf2017/papers/THPB036.pdf
Conference: 18th Int. Conf. RF Superconductivity (SRF'17)
Paper ID: THPB036
Location in proceedings: 821-824
Original Author String: J. Tuggle, M.J. Kelley [Virginia Polytechnic Institute and State University, Blacksburg, USA] M.J. Kelley, U. Pudasaini [The College of William and Mary, Williamsburg, Virginia, USA] M.J. Kelley, A.D. Palczewski, C.E. Reece [JLab, Newport News, Virginia, USA] F.A. Stevie [NCSU AIF, Raleigh, North Carolina, USA]