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[n]	R. Vaglio and V. Palmieri, “Thermal Boundary Resistance Model and Defect Statistical Distribution in Nb/Cu Cavities”, in Proc. SRF'17, Lanzhou, China, Jul. 2017, pp. 374-377. doi:10.18429/JACoW-SRF2017-TUYBA02

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Paper Title: Thermal Boundary Resistance Model and Defect Statistical Distribution in Nb/Cu Cavities
Paper URL: https://jacow.org/srf2017/papers/TUYBA02.pdf
Conference: 18th Int. Conf. RF Superconductivity (SRF'17)
Paper ID: TUYBA02
Location in proceedings: 374-377
Original Author String: R. Vaglio [UniNa, Napoli, Italy] V. Palmieri [INFN/LNL, Legnaro (PD), Italy]

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