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[n]	Y. Tokuda and A. Usami, “Comparison of Neutron and 2 MeV Electron Damage in N-Type Silicon by Deep-Level Transient Spectroscopy”, in Proc. PAC'81, Washington D.C., USA, Mar. 1981, pp. 3564-3569. 

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Paper Title: Comparison of Neutron and 2 MeV Electron Damage in N-Type Silicon by Deep-Level Transient Spectroscopy
Conference: 9th Particle Accelerator Conf. (PAC'81)
Paper ID:
Location in proceedings: 3564-3569
Original Author String: Y. Tokuda, A. Usami

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