[n] D. Sun, P. Datte, F. R. Huson, and W. W. MacKay, “RF Breakdown Test of SiO2 Coated Copper Electrodes”, in Proc. PAC'91, San Francisco, CA, USA, May 1991, pp. 736-739.
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Paper Title: RF Breakdown Test of SiO<sub>2</sub> Coated Copper Electrodes
Conference: 14th Particle Accelerator Conf. (PAC'91)
Paper ID:
Location in proceedings: 736-739
Original Author String: D. Sun, P. Datte, F.R. Huson, W.W. MacKay