[n] S. Leontein and E. Westlin, “Destructive Beam Profile Monitor Electronics using Gated Current Integrators”, in Proc. EPAC'98, Stockholm, Sweden, Jun. 1998, paper WEP10E, pp. 1550-1552.
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Paper Title: Destructive Beam Profile Monitor Electronics using Gated Current Integrators
Paper URL: https://jacow.org/e98/papers/WEP10E.pdf
Conference: 6th European Particle Accelerator Conf. (EPAC'98)
Paper ID: WEP10E
Location in proceedings: 1550-1552
Original Author String: S. Leontein, E. Westlin