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Reference

For Word

[n]	Y. Chu et al., “Data Acquisition and Fault Diagnostic System of Samsung Superconductor Test Facility”, in Proc. ICALEPCS'03, Gyeongju, Korea, Oct. 2003, paper MP515, pp. XX-XX.

For LaTeX

%\cite{Chu:ICALEPCS03-MP515} \bibitem{Chu:ICALEPCS03-MP515} Y. Chu \emph{et al.}, \textquotedblleft{Data Acquisition and Fault Diagnostic System of Samsung Superconductor Test Facility}\textquotedblright, in \emph{Proc. ICALEPCS’03}, Gyeongju, Korea, Oct. 2003, paper MP515, pp. XX--XX.

For BibTeX

@inproceedings{chu:icalepcs03-mp515, author = {Y. Chu and others}, title = {{Data Acquisition and Fault Diagnostic System of Samsung Superconductor Test Facility}}, booktitle = {Proc. ICALEPCS'03}, paper = {MP515}, venue = {Gyeongju, Korea, Oct. 2003}, publisher = {JACoW Publishing, Geneva, Switzerland}, url = {https://jacow.org/ica03/papers/MP515.pdf}, language = {english} }

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Metadata

Paper Title: Data Acquisition and Fault Diagnostic System of Samsung Superconductor Test Facility
Paper URL: https://jacow.org/ica03/papers/MP515.pdf
Conference: 9th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'03)
Paper ID: MP515
Location in proceedings:
Original Author String: Y. Chu, H. Yonekawa, S. Baek, Y.K. Oh, S. Lee, W. Chung, K. Park, B. Lim, H. Park, K. Kim (KBSI) S. Lee (Freecom System Ltd.)

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